HLDVT 2003 is the eighth in a series of annual workshops designed to bring together a community of researchers in the areas of microelectronic design, verification, and test. The workshop revolves around a common theme of addressing the integration of multiple functions on-chip at higher levels of design abstraction, and the techniques and methodologies for validating such systems. The workshop provides an informal forum for discussion of substantive issues that cut across diverse areas in system-level design. Major topics include, but are not limited to, the following:

The Program Committee invites authors to submit an extended summary comprising no more than 4 pages (10pt minimum font size, reasonable margins and line spacing) describing original, unpublished recent work. Clearly describe the nature of the work, explain its significance, highlight novel features, and describe its current status. On the title page, please indicate: title, name and affiliations of all authors, and the topic category. Also identify a contact author and provide complete mailing address, phone number, fax number and an e-mail address. Panel proposals are also invited. All submissions must be made electronically in PDF or Postscript format using the paper submission webpage:

Authors will be notified of the disposition of their papers by August 18, 2003. The submission of an extended summary or panel proposal will be considered evidence that upon acceptance, the author(s) will present their paper or organize their panel at the workshop. Authors of accepted papers will have the option of including a camera-ready copy of their manuscript in the formal workshop proceedings published by the IEEE Computer Society press. The final manuscript will be due in early September 2003, depending on publishing deadlines. Planning is also underway for selected papers to be invited for a journal special issue.

Additional information and contact addresses are available at the conference website:

HLDVT 2003 is sponsored by the IEEE Computer Society Test Technology Technical Council and the IEEE Computer Society Design Automation Technical Committee.